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Meijing Gao, Ailing Tan, Jie Xu, Weiqi Jin, Zhenlong Zu, Ming Yang. Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System[J]. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2018, 27(1): 65-73. DOI: 10.15918/j.jbit1004-0579.201827.0109
Citation: Meijing Gao, Ailing Tan, Jie Xu, Weiqi Jin, Zhenlong Zu, Ming Yang. Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System[J]. JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY, 2018, 27(1): 65-73. DOI: 10.15918/j.jbit1004-0579.201827.0109

Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System

  • Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.
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